Please use this identifier to cite or link to this item:
https://ir.vidyasagar.ac.in/jspui/handle/123456789/773| Title: | Reliability Analysis fornNon-Independent and Non-Identical Series Systems Using Masked Data |
| Authors: | Zhang, Fan Shi, Yi-min |
| Keywords: | Masked Data non-independent system Bayes approach analysis shock model |
| Issue Date: | 2009 |
| Publisher: | Vidyasagar University , Midnapore , West-Bengal , India |
| Series/Report no.: | Journal of Physical Science;Vol 13 [2009] |
| Abstract: | Based on the masked data, the reliability of n non-independent and non-identical series system subjected to n +1sources of fatal shocks is investigated. We get the parameter estimations as well as reliability estimations by adopting Bayes approach. Also, a numerical simulation example is given to illustrate how one can utilize the method to tackle the practical problem |
| Description: | 1-12 |
| URI: | http://inet.vidyasagar.ac.in:8080/jspui/handle/123456789/773 |
| ISSN: | 0972-8791 (Print) |
| Appears in Collections: | Journal of Physical Sciences Vol.13 [2009] |
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