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https://ir.vidyasagar.ac.in/jspui/handle/123456789/773Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Zhang, Fan | |
| dc.contributor.author | Shi, Yi-min | |
| dc.date.accessioned | 2016-12-22T17:15:57Z | - |
| dc.date.available | 2016-12-22T17:15:57Z | - |
| dc.date.issued | 2009 | |
| dc.identifier.issn | 0972-8791 (Print) | |
| dc.identifier.uri | http://inet.vidyasagar.ac.in:8080/jspui/handle/123456789/773 | - |
| dc.description | 1-12 | en_US |
| dc.description.abstract | Based on the masked data, the reliability of n non-independent and non-identical series system subjected to n +1sources of fatal shocks is investigated. We get the parameter estimations as well as reliability estimations by adopting Bayes approach. Also, a numerical simulation example is given to illustrate how one can utilize the method to tackle the practical problem | en_US |
| dc.language.iso | en_US | en_US |
| dc.publisher | Vidyasagar University , Midnapore , West-Bengal , India | en_US |
| dc.relation.ispartofseries | Journal of Physical Science;Vol 13 [2009] | |
| dc.subject | Masked Data | en_US |
| dc.subject | non-independent system | en_US |
| dc.subject | Bayes approach | en_US |
| dc.subject | analysis | en_US |
| dc.subject | shock model | en_US |
| dc.title | Reliability Analysis fornNon-Independent and Non-Identical Series Systems Using Masked Data | en_US |
| dc.type | Article | en_US |
| Appears in Collections: | Journal of Physical Sciences Vol.13 [2009] | |
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